聚合物的仲离子产率

T. Ogama, H. Kurokawa, I. Karino
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引用次数: 1

摘要

对聚四氟乙烯(PTFE)和聚乙烯(PE)的二次离子产率与Al2O3中Al+的二次离子产率进行了比较。用x射线光发射光谱(XPS)测定了混合物的表面成分。用1 keV的Ar+进行二次离子质谱(SIMS)测量,结果表明,从PTFE中得到CF+和从PE中得到C2H+3的二次离子产率分别是从Al2O3中得到Al+的20倍和4倍。用失重法测定了聚四氟乙烯的溅射收率;结果表明,聚四氟乙烯的二次离子产率高主要是由于其溅射产率高。
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Secondary ion yields of polymers

The secondary ion yields of polytetrafluoroethylene (PTFE) and polyethylene (PE) were compared with that of Al+ emitted from Al2O3 using mixed samples of their powders. The surface compositions of mixtures were measured by means of X-ray photoemission spectroscopy (XPS). Secondary ion mass spectrometry (SIMS) measurements with 1 keV Ar+ showed that the secondary ion yields of CF+ from PTFE and C2H+3 from PE were ∼ 20 and ∼ 4 times larger than that of Al+ from Al2O3, respectively. The sputtering yield of PTFE was also examined by weight loss measurements; the results suggest that the large secondary ion yield of PTFE is primarily due to its large sputtering yield.

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