{"title":"亚皮秒泵浦脉冲激发下半导体发射太赫兹辐射的几何因素","authors":"R. Lewis","doi":"10.1109/IRMMW-THZ.2011.6104830","DOIUrl":null,"url":null,"abstract":"Geometrical factors play an important role in the emission of terahertz radiation from semiconductors, as has been recognized for many years. This is particularly the case for the mechanism of optical rectification. Early work in the area was concerned with simple geometric arrangements, such as normal incidence of the pump radiation on the emitter surface, and low-index crystal faces, such as (001), (011), and (111). In this paper the general problem will be described for arbitrary angles of incidence and detection relative to the emitter crystal axes. It is seen that new information about the bulk and surface contributions to the optical rectification emission is obtained.","PeriodicalId":6353,"journal":{"name":"2011 International Conference on Infrared, Millimeter, and Terahertz Waves","volume":"24 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Geometrical factors in the emission of terahertz radiation from semiconductors under excitation by sub-picosecond pump pulses\",\"authors\":\"R. Lewis\",\"doi\":\"10.1109/IRMMW-THZ.2011.6104830\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Geometrical factors play an important role in the emission of terahertz radiation from semiconductors, as has been recognized for many years. This is particularly the case for the mechanism of optical rectification. Early work in the area was concerned with simple geometric arrangements, such as normal incidence of the pump radiation on the emitter surface, and low-index crystal faces, such as (001), (011), and (111). In this paper the general problem will be described for arbitrary angles of incidence and detection relative to the emitter crystal axes. It is seen that new information about the bulk and surface contributions to the optical rectification emission is obtained.\",\"PeriodicalId\":6353,\"journal\":{\"name\":\"2011 International Conference on Infrared, Millimeter, and Terahertz Waves\",\"volume\":\"24 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 International Conference on Infrared, Millimeter, and Terahertz Waves\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRMMW-THZ.2011.6104830\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Conference on Infrared, Millimeter, and Terahertz Waves","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2011.6104830","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Geometrical factors in the emission of terahertz radiation from semiconductors under excitation by sub-picosecond pump pulses
Geometrical factors play an important role in the emission of terahertz radiation from semiconductors, as has been recognized for many years. This is particularly the case for the mechanism of optical rectification. Early work in the area was concerned with simple geometric arrangements, such as normal incidence of the pump radiation on the emitter surface, and low-index crystal faces, such as (001), (011), and (111). In this paper the general problem will be described for arbitrary angles of incidence and detection relative to the emitter crystal axes. It is seen that new information about the bulk and surface contributions to the optical rectification emission is obtained.