{"title":"基于钛扩散铌酸锂基波导的汉明码检查器设计","authors":"V. Srivastava, A. Pal, Sandeep Sharma","doi":"10.1080/01468030.2019.1621962","DOIUrl":null,"url":null,"abstract":"ABSTRACT This work presents an electro-optic effect-based design for the widely used Hamming code for checking single bit errors in the received data. The structure is based on Mach-Zehnder Interferometer, designed using Titanium-diffused Lithium Niobate-based waveguides. The proposed device has been successfully tested using the beam propagation method. For a received 7-bit code, the three simultaneously generated check bits are combined to check the error position. Critical performance parameters like extinction ratio (24.39dB), contrast ratio (25.711dB), insertion loss (0.041dB), and amplitude modulation (0.079dB) calculated for the overall device are within acceptable limits for the feasibility of the device.","PeriodicalId":50449,"journal":{"name":"Fiber and Integrated Optics","volume":"62 1","pages":"218 - 235"},"PeriodicalIF":2.3000,"publicationDate":"2019-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Design of Hamming Code Checker Using Titanium-Diffused Lithium Niobate-Based Waveguide\",\"authors\":\"V. Srivastava, A. Pal, Sandeep Sharma\",\"doi\":\"10.1080/01468030.2019.1621962\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"ABSTRACT This work presents an electro-optic effect-based design for the widely used Hamming code for checking single bit errors in the received data. The structure is based on Mach-Zehnder Interferometer, designed using Titanium-diffused Lithium Niobate-based waveguides. The proposed device has been successfully tested using the beam propagation method. For a received 7-bit code, the three simultaneously generated check bits are combined to check the error position. Critical performance parameters like extinction ratio (24.39dB), contrast ratio (25.711dB), insertion loss (0.041dB), and amplitude modulation (0.079dB) calculated for the overall device are within acceptable limits for the feasibility of the device.\",\"PeriodicalId\":50449,\"journal\":{\"name\":\"Fiber and Integrated Optics\",\"volume\":\"62 1\",\"pages\":\"218 - 235\"},\"PeriodicalIF\":2.3000,\"publicationDate\":\"2019-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fiber and Integrated Optics\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.1080/01468030.2019.1621962\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fiber and Integrated Optics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1080/01468030.2019.1621962","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
Design of Hamming Code Checker Using Titanium-Diffused Lithium Niobate-Based Waveguide
ABSTRACT This work presents an electro-optic effect-based design for the widely used Hamming code for checking single bit errors in the received data. The structure is based on Mach-Zehnder Interferometer, designed using Titanium-diffused Lithium Niobate-based waveguides. The proposed device has been successfully tested using the beam propagation method. For a received 7-bit code, the three simultaneously generated check bits are combined to check the error position. Critical performance parameters like extinction ratio (24.39dB), contrast ratio (25.711dB), insertion loss (0.041dB), and amplitude modulation (0.079dB) calculated for the overall device are within acceptable limits for the feasibility of the device.
期刊介绍：
Fiber and Integrated Optics , now incorporating the International Journal of Optoelectronics, is an international bimonthly journal that disseminates significant developments and in-depth surveys in the fields of fiber and integrated optics. The journal is unique in bridging the major disciplines relevant to optical fibers and electro-optical devices. This results in a balanced presentation of basic research, systems applications, and economics. For more than a decade, Fiber and Integrated Optics has been a valuable forum for scientists, engineers, manufacturers, and the business community to exchange and discuss techno-economic advances in the field.
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