{"title":"为保修销售的产品提供最优的开发测试政策","authors":"D.N.P. Murthy, D.G. Nguyen","doi":"10.1016/0143-8174(87)90106-5","DOIUrl":null,"url":null,"abstract":"<div><p>This paper deals with product development to improve product quality. It examines two stochastic models incorporating development testing and derives the optimal testing plans to minimize expected costs for products sold with warranty.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 2","pages":"Pages 113-123"},"PeriodicalIF":0.0000,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90106-5","citationCount":"17","resultStr":"{\"title\":\"Optimal development testing policies for products sold with warranty\",\"authors\":\"D.N.P. Murthy, D.G. Nguyen\",\"doi\":\"10.1016/0143-8174(87)90106-5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>This paper deals with product development to improve product quality. It examines two stochastic models incorporating development testing and derives the optimal testing plans to minimize expected costs for products sold with warranty.</p></div>\",\"PeriodicalId\":101070,\"journal\":{\"name\":\"Reliability Engineering\",\"volume\":\"19 2\",\"pages\":\"Pages 113-123\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1987-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0143-8174(87)90106-5\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Reliability Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0143817487901065\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reliability Engineering","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0143817487901065","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optimal development testing policies for products sold with warranty
This paper deals with product development to improve product quality. It examines two stochastic models incorporating development testing and derives the optimal testing plans to minimize expected costs for products sold with warranty.
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