物联网分析、指纹和身份识别研究综述

IF 3.5 Q2 COMPUTER SCIENCE, INFORMATION SYSTEMS ACM Transactions on Internet of Things Pub Date : 2022-05-31 DOI:10.1145/3539736
Miraqa Safi, S. Dadkhah, Farzaneh Shoeleh, Hassan Mahdikhani, Heather Molyneaux, A. Ghorbani
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引用次数: 11

摘要

连接到互联网的异构物联网(IoT)设备的激增产生了一些操作和安全挑战,例如监控、检测和识别数百万互联的物联网设备。网络和系统管理员必须正确识别哪些设备是正常的,哪些设备需要安全更新,哪些设备容易受到特定攻击。物联网分析是一种新兴技术,用于识别和验证连接设备的特定行为,并在网络中隔离可疑和易受攻击的设备,以进行进一步监控。本文全面回顾了各种物联网设备分析方法,并基于不同的安全角度为物联网分析技术提供了清晰的分类。我们首先研究了几种当前的物联网设备分析技术及其应用。接下来,我们分析了各种物联网设备漏洞,概述了多个特征,并提供了详细信息,以实现分析算法的风险评估/缓解阶段。通过回顾分析物联网设备的方法,我们确定了不同领域的组织可以实施的各种最先进的方法,以满足分析需求。此外,本文还讨论了用于物联网设备分析的几种机器学习和深度学习算法。最后,我们讨论了该领域的挑战和未来研究的可能性。
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A Survey on IoT Profiling, Fingerprinting, and Identification
The proliferation of heterogeneous Internet of things (IoT) devices connected to the Internet produces several operational and security challenges, such as monitoring, detecting, and recognizing millions of interconnected IoT devices. Network and system administrators must correctly identify which devices are functional, need security updates, or are vulnerable to specific attacks. IoT profiling is an emerging technique to identify and validate the connected devices’ specific behaviour and isolate the suspected and vulnerable devices within the network for further monitoring. This article provides a comprehensive review of various IoT device profiling methods and provides a clear taxonomy for IoT profiling techniques based on different security perspectives. We first investigate several current IoT device profiling techniques and their applications. Next, we analyzed various IoT device vulnerabilities, outlined multiple features, and provided detailed information to implement profiling algorithms’ risk assessment/mitigation stage. By reviewing approaches for profiling IoT devices, we identify various state-of-the-art methods that organizations of different domains can implement to satisfy profiling needs. Furthermore, this article also discusses several machine learning and deep learning algorithms utilized for IoT device profiling. Finally, we discuss challenges and future research possibilities in this domain.
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来源期刊
CiteScore
5.20
自引率
3.70%
发文量
0
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