擦除编码数据中心可靠性仿真分析

Mi Zhang, Shujie Han, P. Lee
{"title":"擦除编码数据中心可靠性仿真分析","authors":"Mi Zhang, Shujie Han, P. Lee","doi":"10.1109/SRDS.2017.19","DOIUrl":null,"url":null,"abstract":"Erasure coding has been widely adopted to protect data storage against failures in production data centers. Given the hierarchical nature of data centers, characterizing the effects of erasure coding and redundancy placement on the reliability of erasure-coded data centers is critical yet largely unexplored. This paper presents a comprehensive simulation analysis of reliability on erasure-coded data centers. We conduct the analysis by building a discrete-event simulator called SIMEDC, which reports reliability metrics of an erasure-coded data center based on the configurable inputs of the data center topology, erasure codes, redundancy placement, and failure/repair patterns of different subsystems obtained from statistical models or production traces. Our simulation results show that placing erasure-coded data in fewer racks generally improves reliability by reducing cross-rack repair traffic, even though it sacrifices rack-level fault tolerance in the face of correlated failures.","PeriodicalId":6475,"journal":{"name":"2017 IEEE 36th Symposium on Reliable Distributed Systems (SRDS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"A Simulation Analysis of Reliability in Erasure-Coded Data Centers\",\"authors\":\"Mi Zhang, Shujie Han, P. Lee\",\"doi\":\"10.1109/SRDS.2017.19\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Erasure coding has been widely adopted to protect data storage against failures in production data centers. Given the hierarchical nature of data centers, characterizing the effects of erasure coding and redundancy placement on the reliability of erasure-coded data centers is critical yet largely unexplored. This paper presents a comprehensive simulation analysis of reliability on erasure-coded data centers. We conduct the analysis by building a discrete-event simulator called SIMEDC, which reports reliability metrics of an erasure-coded data center based on the configurable inputs of the data center topology, erasure codes, redundancy placement, and failure/repair patterns of different subsystems obtained from statistical models or production traces. Our simulation results show that placing erasure-coded data in fewer racks generally improves reliability by reducing cross-rack repair traffic, even though it sacrifices rack-level fault tolerance in the face of correlated failures.\",\"PeriodicalId\":6475,\"journal\":{\"name\":\"2017 IEEE 36th Symposium on Reliable Distributed Systems (SRDS)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE 36th Symposium on Reliable Distributed Systems (SRDS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SRDS.2017.19\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 36th Symposium on Reliable Distributed Systems (SRDS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SRDS.2017.19","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

摘要

在生产数据中心中,Erasure编码被广泛用于保护数据存储免受故障的影响。考虑到数据中心的分层性质,描述擦除编码和冗余放置对擦除编码数据中心可靠性的影响至关重要,但在很大程度上尚未得到探索。本文对擦除编码数据中心的可靠性进行了全面的仿真分析。我们通过构建一个名为SIMEDC的离散事件模拟器来进行分析,该模拟器根据从统计模型或生产轨迹获得的数据中心拓扑、擦除代码、冗余位置和不同子系统的故障/修复模式的可配置输入,报告擦除编码数据中心的可靠性指标。我们的仿真结果表明,将擦除编码的数据放置在较少的机架上通常可以通过减少跨机架的修复流量来提高可靠性,即使它在面对相关故障时牺牲了机架级别的容错能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
A Simulation Analysis of Reliability in Erasure-Coded Data Centers
Erasure coding has been widely adopted to protect data storage against failures in production data centers. Given the hierarchical nature of data centers, characterizing the effects of erasure coding and redundancy placement on the reliability of erasure-coded data centers is critical yet largely unexplored. This paper presents a comprehensive simulation analysis of reliability on erasure-coded data centers. We conduct the analysis by building a discrete-event simulator called SIMEDC, which reports reliability metrics of an erasure-coded data center based on the configurable inputs of the data center topology, erasure codes, redundancy placement, and failure/repair patterns of different subsystems obtained from statistical models or production traces. Our simulation results show that placing erasure-coded data in fewer racks generally improves reliability by reducing cross-rack repair traffic, even though it sacrifices rack-level fault tolerance in the face of correlated failures.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
PULP: Achieving Privacy and Utility Trade-Off in User Mobility Data On Availability for Blockchain-Based Systems Runtime Measurement Architecture for Bytecode Integrity in JVM-Based Cloud Performance Modeling of PBFT Consensus Process for Permissioned Blockchain Network (Hyperledger Fabric) CausalSpartan: Causal Consistency for Distributed Data Stores Using Hybrid Logical Clocks
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1