基于x射线暗场成像的折射对比CT测量系统用于μm级乳腺组织标本成像

N. Sunaguchi, Z. Huang, K. Taniguchi, D. Shimao, T. Yuasa, R. Nishimura, A. Iwakoshi, M. Ando, S. Ichihara
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引用次数: 0

摘要

近年来,生物软组织三维病理观察的重要性日益增加,各种方便获取三维信息的可视化工具和以三维微观结构为重点的分析方法应运而生。基于x射线暗场成像技术(XDFI)的折射对比计算机断层扫描是一种具有高对比度和空间分辨率的有效方法。在本研究中,为了将XDFI作为一种新的病理工具,我们将开发XDFI成像系统的重要组成部分x射线光学元件和x射线相机,以实现5 μm的空间分辨率,并通过x射线显微图和乳腺组织标本的实验来评估空间分辨率。
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Refraction-contrast CT measurement system based on x-ray dark field imaging for μm-order scale imaging of breast tissue specimens
The importance of the three-dimensional (3D) pathological observation of biological soft tissues has increased in recent year, and various visualization tools to obtain 3D information easily and analysis methods focusing on the 3D micro structures have been developed. Refraction-contrast computed tomography based on x-ray dark-field imaging technique (XDFI) is one of the powerful methods with a high contrast and spatial resolution. In this study, in order to apply XDFI as new pathology tool, we will develop the x-ray optics and the x-ray camera, which are important components of the XDFI imaging system, to achieve a spatial resolution of 5 μm and evaluate the spatial resolution by experiments of the x-ray micro chart and the breast tissue specimen.
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