{"title":"使用离子束斜角技术的半导体多层结构的AES深度剖面","authors":"M. Procop, A. Klein, I. Rechenberg, D. Krüger","doi":"10.1007/S002160050429","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"16 4","pages":"358-360"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"AES Depth profiling of semiconducting multilayer structures using an ion beam bevelling technique\",\"authors\":\"M. Procop, A. Klein, I. Rechenberg, D. Krüger\",\"doi\":\"10.1007/S002160050429\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":12375,\"journal\":{\"name\":\"Fresenius' Journal of Analytical Chemistry\",\"volume\":\"16 4\",\"pages\":\"358-360\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fresenius' Journal of Analytical Chemistry\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/S002160050429\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fresenius' Journal of Analytical Chemistry","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/S002160050429","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}