厚钨涂层的化学气相沉积:拉曼测量和质量输运模型

M. Pons, A. Benezech, P. Huguet, R. Gaufrès, P. Diez, D. Lafforet
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引用次数: 0

摘要

采用化学气相沉积(CVD)方法,在773-1073 K的温度范围内,在减压条件下,用h2 - wf6制备了厚钨涂层。实验装置设计用于原位拉曼分析钨涂层生长过程中的气相(温度和wf6浓度)。提出了二维质量输运模型。它假设一个简单的化学途径。只考虑了wf6的h2减量。本文的主要目的是报告(1)实验沉积速率与模型预测的沉积速率之间的比较,(2)由拉曼光谱测量得出的温度和气相组成值与数值计算得到的这些值之间的比较。这些比较表明了数值模拟的预测能力,并且拉曼设备可以记录沉积过程中的温度和wf6分压。
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Chemical Vapour Deposition of Thick Tungsten Coatings : Raman Measurements and Mass Transport Modelling
Thick tungsten coatings have been produced by chemical vapour deposition (CVD) from H 2 -WF 6 at a temperature in the range 773-1073 K under a reduced pressure. The experimental set-up is designed for in situ Raman analysis of the gas phase (temperature and WF 6 concentration) during the growth of tungsten coatings. A two dimensional mass transport model was proposed. It assumes a simple chemical pathway. Only the H 2 reduction of WF 6 has been taken into account. The major objective of the paper is to report on the comparison between (i) the experimental deposition rate and the deposition rate predicted by the model, (it) the values of temperature and gas phase composition deduced from Raman spectroscopy measurements and the values of these quantities obtained by numerical calculations. These comparisons have shown the predictive capabilities of the numerical modelling and that the temperature and WF 6 partial pressures can be recorded by a Raman equipment during the deposition process.
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