{"title":"基于结构方程扫描的成人高血压发病机制及影响因素","authors":"Scanning","doi":"10.1155/2023/9823960","DOIUrl":null,"url":null,"abstract":"<p><p>[This retracts the article DOI: 10.1155/2022/2663604.].</p>","PeriodicalId":21633,"journal":{"name":"Scanning","volume":"2023 ","pages":"9823960"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10307347/pdf/","citationCount":"0","resultStr":"{\"title\":\"Retracted: The Pathogenesis and Influencing Factors of Adult Hypertension Based on Structural Equation Scanning.\",\"authors\":\"Scanning\",\"doi\":\"10.1155/2023/9823960\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>[This retracts the article DOI: 10.1155/2022/2663604.].</p>\",\"PeriodicalId\":21633,\"journal\":{\"name\":\"Scanning\",\"volume\":\"2023 \",\"pages\":\"9823960\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10307347/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Scanning\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1155/2023/9823960\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scanning","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1155/2023/9823960","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Physics and Astronomy","Score":null,"Total":0}
期刊介绍:
Scanning provides an international and interdisciplinary medium for the rapid exchange of information among all scientists interested in scanning electron, scanning probe, and scanning optical microscopies. Areas of specific interest include all aspects of the instrumentation associated with scanning microscopies, correlative microscopy techniques, stereometry, stereology, analytic techniques, and novel applications of the microscopies.