2018 IEEE International Reliability Physics Symposium (IRPS)

Reliability perspective of resistive synaptic devices on the neuromorphic system performance

Pub Date : 2018-05-25 DOI: 10.1109/IRPS.2018.8353615 Pai-Yu Chen, Shimeng Yu

High-density fan-out technology for advanced SiP and 3D heterogeneous integration

Pub Date : 2018-03-11 DOI: 10.1109/IRPS.2018.8353588 Kangwook Lee

Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications

Pub Date : 2018-03-11 DOI: 10.1109/IRPS.2018.8353553 E. Wu, A. Kim, Baozhen Li, J. Stathis