2017 IEEE Symposium on Product Compliance Engineering (ISPCE)

What does it mean when your measurement is just within, or just outside of limits? Dealing with risks due to measurement errors and their implication on safety

Pub Date : 2017-05-26 DOI: 10.1109/ISPCE.2017.7935017 S. Mozar, W. Kao

Generalized formula for the calculation of a probabilistic metric for random hardware failures in redundant subsystems

Pub Date : 2017-05-08 DOI: 10.1109/ISPCE.2017.7935021 Atsushi Sakurai

AC vs. DC dielectric withstand testing: Allowing AC or DC testing in 61010-1 3rd edition

Pub Date : 2017-05-08 DOI: 10.1109/ISPCE.2017.7935015 Nicholas Piotrowski