2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)

Measurement time reduction technique for input referred noise of dynamic comparator

Pub Date : 2018-06-12 DOI: 10.1109/ICMTS.2018.8383799 Yukiko Ishijima, S. Nakagawa, H. Ishikuro

Novel test structures for extracting interface state density of advanced CMOSFETs using optical charge pumping

Pub Date : 2018-03-19 DOI: 10.1109/ICMTS.2018.8383753 Hyeong-Sub Song, Dong-Jun Oh, So-Yeong Kim, Sungkyu Kwon, Sung-Jin Choi, D. Kim, D. Lim, Changhwan Choi, D. M. Kim, H. Lee

Quantitative model of CMOS inverter chain ring oscillator's effective capacitance and its improvements in 14nm FinFET technology

Pub Date : 2018-03-19 DOI: 10.1109/ICMTS.2018.8383787 S. Mun, J. Cho, B. Zhu, P. Agnihotri, C. Y. Wong, T. Lee, V. Mahajan, B. Liu, Y. Shi, W. Hong, J. Ciavatti, J. G. Lee, S. Samavedam, D. K. Sohn