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2013 IEEE International Conference of Electron Devices and Solid-state Circuits

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2013 IEEE International Conference of Electron Devices and Solid-state Circuits

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2013 IEEE International Conference of Electron Devices and Solid-state Circuits - 最新文献

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Recent development of surface integral equation solvers for multiscale interconnects and circuits

Pub Date : 2013-06-03 DOI: 10.1109/EDSSC.2013.6628158 Sheng Sun, Lijun Jiang, W. Chew

The advanced sensor applied to the dust-charged detection

Pub Date : 2013-06-03 DOI: 10.1109/EDSSC.2013.6628171 M. Cao, Xuezhen Cheng, Yu Hong

Device variability and reliability check for ultra-thin-body and bulk oxide CMOSFETs

Pub Date : 2013-06-03 DOI: 10.1109/EDSSC.2013.6628081 W. Yeh, C. Lai, L. Chin, Po-Ying Chen
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