2022 IEEE European Test Symposium (ETS)

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Trojan Insertions of Fully Programmable Valve Arrays

Pub Date : 2022-05-23 DOI: 10.1109/ETS54262.2022.9810384 Nadun Sinhabahu, Jian-De Li, Katherine Shu-Min Li, Sying-Jyan Wang, Tsung-Yi Ho

Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization

Pub Date : 2022-05-23 DOI: 10.1109/ETS54262.2022.9810416 H. Amrouch, K. Chakrabarty, D. Pflüger, I. Polian, M. Sauer, M. Reorda

Graph Theory Approach for Multi-site ATE Board Parameter Extraction

Pub Date : 2022-05-23 DOI: 10.1109/ETS54262.2022.9810391 Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen

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