2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC)

FinFET: From compact modeling to circuit performance

Pub Date : 2010-12-01 DOI: 10.1109/EDSSC.2010.5713788 F. He, Xingye Zhou, Chenyue Ma, Jian Zhang, Zhiwei Liu, Wen Wu, Xukai Zhang, Lining Zhang

Electrical characterization of self-aligned titanium silicide SBDs formed by furnace annealing

Pub Date : 2010-12-01 DOI: 10.1109/EDSSC.2010.5713677 Elena Barbarini, S. Ferrero, C. Pirri

A low noise charge sensitive amplifier with adjustable leakage compensation in 0.18µm CMOS process

Pub Date : 2010-12-01 DOI: 10.1109/EDSSC.2010.5713693 Xiangyu Li, Qi Zhang, Yihe Sun