Microelectronics Journal

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中科院SCI期刊分区 WOS期刊分区历年影响因子历年发表投稿信息同类期刊

期刊缩写：

Microelectron. J. copy

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影响因子：

期刊影响因子(Impact factor，IF) 即某刊平均每篇论文的被引用数，是表征期刊影响大小的一项定量指标，它实际上是某刊在某年被全部源刊物引证该刊前两年发表论文的次数，与该刊前两年所发表的全部源论文数之比。

1.9

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ISSN：

ISSN是由8个数字组成的编码，旨在识别各种报纸、专业杂志、画报、期刊，无论其性质或载体版本（纸版及电子版）。

print: 0026-2692

研究领域：

工程技术-工程：电子与电气

h-index：

h-index是指该期刊有h篇文章至少被引用h次，是一项简单易懂的评估指标，不像平均值会受极端值影响，可呈现出多数文章的被引用表现。Google使用过去5年的h-index数据评价期刊的影响力，“h5指数”比较难以被人为操控，不会因为多了一篇超高被引论文而明显增长，另一方面，刻意减少发文量也不会对提升h5指数有作用。

自引率：

27.30%

Gold OA文章占比：

Gold OA文章占比是指一个总体中金色OA文章数量占总体文章数量的比重。OA期刊的文章主要通过金色通道（Gold road，也称为Gold OA，即期刊官网）和绿色通道（Green road，或Green OA）实现开放获取。金色通道是开放获取期刊通过自己的官网来实现的，而绿色通道是通过把文章自存档于机构知识库(Institutional Repositories，比如哈佛大学学术库DASH）或学科知识库中来实现。

2.61%

原创研究文献占比：

99.18%

SCI收录类型：

Science Citation Index Expanded (SCIE) || Scopus (CiteScore)

期刊官网：

http://www.journals.elsevier.com/microelectronics-journal/

期刊介绍英文：

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.

CiteScore：

引用分数（英语：CiteScore，CS）是一种用来反映学术期刊最近发表文章“年平均被引用次数”的衡量指标。该指标由Elsevier于 2016 年 12 月推出，以替代常用的JCR影响因子（由Clarivate计算）。 CiteScore是Scopus中系列期刊指标的一部分，包括 SNIP(源文档标准化影响)，SJR (SClmago杂志排名)，引用文档计数以及引用百分比。

CiteScore	SJR	SNIP	CiteScore排名
4.0	0.390	0.854	学科排名百分位大类：Physics and Astronomy 小类：Condensed Matter Physics 181 / 434 58% 大类：Engineering 小类：Electrical and Electronic Engineering 332 / 797 58% 大类：Physics and Astronomy 小类：Atomic and Molecular Physics, and Optics 101 / 224 55% 大类：Materials Science 小类：Surfaces, Coatings and Films 61 / 132 54% 大类：Materials Science 小类：Electronic, Optical and Magnetic Materials 133 / 284 53%