2019 Symposium on VLSI Technology

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Microscopic Crystal Phase Inspired Modeling of Zr Concentration Effects in Hf1-xZrxO2Thin Films

Pub Date : 2019-06-09 DOI: 10.23919/VLSIT.2019.8776533 A. Saha, B. Grisafe, S. Datta, S. Gupta

Ferroelectric and Anti-Ferroelectric Hafnium Zirconium Oxide: Scaling Limit, Switching Speed and Record High Polarization Density

Pub Date : 2019-06-09 DOI: 10.23919/VLSIT.2019.8776548 X. Lyu, M. Si, X. Sun, M. Capano, H. Wang, Peide D. Ye

2nm Node: Benchmarking FinFET vs Nano-Slab Transistor Architectures for Artificial Intelligence and Next Gen Smart Mobile Devices

Pub Date : 2019-06-09 DOI: 10.23919/VLSIT.2019.8776478 S. Song, B. Colombeau, M. Bauer, V. Moroz, X. Lin, P. Asenov, D. Sherlekar, M. Choi, J. Huang, B. Cheng, C. Chidambaram, S. Natarajan

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