Study of superconducting microstrip line using transverse resonance technique

Abstract

In this paper wepresent the analysis of superconducting microstrip lines in which the effect of finite complex conductivity is taken into account, through the equivalent circuit concept with transverse resonance technique. In our study a modified circuit has been used to compute the superconducting strip losses, through using a series of testing and basis function in Galerkin method. A numerical study for attenuation constant, superconducting strip current distribution, and eflective dielectric constant are presented. A comparison with published data available in the literature gives good agreement.