Babu Turumella, Aiman Kabakibo, Manjunath Bogadi, Karakunakara Menon, Shaleah Thusoo, Long Nguyen, N. Saxena, Michael Chow
{"title":"Design verification of a super-scalar RISC processor","authors":"Babu Turumella, Aiman Kabakibo, Manjunath Bogadi, Karakunakara Menon, Shaleah Thusoo, Long Nguyen, N. Saxena, Michael Chow","doi":"10.1109/FTCS.1995.466951","DOIUrl":null,"url":null,"abstract":"The paper provides an overview of the design verification methodology for HaL's Sparc64 processor development. This activity covered approximately two and a half years of design development time. Objectives and challenges are discussed and the verification methodology is described. Monitoring mechanisms that give high observability to internal design states, novel features that increase the simulation speed, and tools for automatic result checking are described. Also presented for the first time, is an analysis of the design defects discovered during the verification process. Such an analysis is useful in augmenting verification programs to target common design defects.<<ETX>>","PeriodicalId":309075,"journal":{"name":"Twenty-Fifth International Symposium on Fault-Tolerant Computing. Digest of Papers","volume":"24 8","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Twenty-Fifth International Symposium on Fault-Tolerant Computing. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTCS.1995.466951","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The paper provides an overview of the design verification methodology for HaL's Sparc64 processor development. This activity covered approximately two and a half years of design development time. Objectives and challenges are discussed and the verification methodology is described. Monitoring mechanisms that give high observability to internal design states, novel features that increase the simulation speed, and tools for automatic result checking are described. Also presented for the first time, is an analysis of the design defects discovered during the verification process. Such an analysis is useful in augmenting verification programs to target common design defects.<>