N. Barylo, O. Boyko, R. Holyaka, P. Stakhira, S. Kutsiy, I. Yaremchuk
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引用次数: 0
Abstract
The work is devoted to the problem of developing the structure of an organic light-emitting diode (OLED) and mixed signal front-end with extended functionality, specifically, in-situ measurement of the current-voltage (I-V) characteristics of the structure directly during their operation. The OLED structure uses long-term thermally activated delayed fluorescence (TADF) of the TPAPm organic film. The measurement of I-V characteristics of OLED structures is carried out on the transient processes of voltage formation in the step-up circuits of the drivers. The OLED front-end is implemented on a programmable system on a PSoC chip of the 5LP Family Cypress Semiconductor Corporation. The results of the work are used for optical MEMS sensors using organic light sources.
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