Secure scan-based design using Blum Blum Shub algorithm

Elnaz Koopahi, S. E. Borujeni
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引用次数: 7

Abstract

Scan design is a powerful Design-for-Testability (DFT) technique that enhances controllability and observability of internal nodes of the circuit under test. However, it can increase system vulnerability being a back door to access secret information of a secure chip. In this paper, we present a scan-based design which is robust against scan-based side channel attacks. We use SHA256 secure hash and Blum Blum Shub pseudo random number generator to create a simple challenge/response scheme. The system can be used to enable JTAG instructions for authorized user or control access to IEEE 1687 on-chip instruments. The effectiveness of the proposed method has been verified using NIST statistical test suite.
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基于安全扫描的设计采用Blum Blum Shub算法
扫描设计是一种强大的可测试性设计(DFT)技术,它增强了被测电路内部节点的可控性和可观察性。但是,它作为访问安全芯片机密信息的后门,增加了系统的脆弱性。在本文中,我们提出了一种基于扫描的设计,它对基于扫描的侧信道攻击具有鲁棒性。我们使用SHA256安全哈希和Blum Blum Shub伪随机数生成器来创建一个简单的挑战/响应方案。该系统可用于为授权用户启用JTAG指令或控制对IEEE 1687片上仪器的访问。采用NIST统计测试套件验证了该方法的有效性。
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