Health and Remaining Useful Life Estimation of Electronic Circuits

Abstract

This chapter develops a kernel‐based learning technique to estimate the health degradation of an electronic circuit due to parametric deviation in the circuit components. A model‐based filtering method is developed for predicting the remaining useful life (RUL) of electronic circuit‐comprising components exhibiting parametric faults. The existing approaches for predicting failures resulting from electronic component parametric faults emphasize identifying monotonically deviating parameters and modeling their progression over time. The existing literature is classified and reviewed based on the approach employed for health estimation and failure prediction ‐ either the component‐centric approach or the circuit‐centric approach. The chapter presents the developed first‐principles‐based model to capture the degradation in circuit performance. It discusses the stochastic algorithm used for joint state‐parameter estimation and RUL prediction. The chapter describes the validation results using data obtained from simulation‐based experiments on the critical circuits of a direct‐current (DC)‐DC converter system.