C. Spillard, S. Pennock, P. Shepherd, M. H. Burchett
{"title":"An Improved Equivalent Circuit Representation of Stripline Step in Width Discontinuities","authors":"C. Spillard, S. Pennock, P. Shepherd, M. H. Burchett","doi":"10.1109/EUMA.1994.337505","DOIUrl":null,"url":null,"abstract":"This paper presents an improved equivalent circuit representation of symmetrical stripline step in width discontinuities. The discontinuity model is developed from results computed using a FDTD graded mesh algorithm which offers improved efficiency over conventional FDTD algorithms. Results are presented for the series inductance of the discontinuity which shows lower values than those previously published. Results for the line extension introduced by the step in width indicate the extension is negligible, which is verified by previously published measured data.","PeriodicalId":440371,"journal":{"name":"1994 24th European Microwave Conference","volume":"41 18","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1994 24th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1994.337505","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents an improved equivalent circuit representation of symmetrical stripline step in width discontinuities. The discontinuity model is developed from results computed using a FDTD graded mesh algorithm which offers improved efficiency over conventional FDTD algorithms. Results are presented for the series inductance of the discontinuity which shows lower values than those previously published. Results for the line extension introduced by the step in width indicate the extension is negligible, which is verified by previously published measured data.
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