{"title":"Pseudo-random generators and structure of complete degrees","authors":"Manindra Agrawal","doi":"10.1109/CCC.2002.1004349","DOIUrl":null,"url":null,"abstract":"It is shown that, if there exist sets in E (the exponential complexity class) that require 2/sup /spl Omega/(n)/-sized circuits, then sets that are hard for class P (the polynomial complexity class) and above, under 1-1 reductions, are also hard under 1-1 size-increasing reductions. Under the assumption of the hardness of solving the RSA (Rivest-Shamir-Adleman, 1978) problem or the discrete log problem, it is shown that sets that are hard for class NP (nondeterministic polynomial) and above, under many-1 reductions, are also hard under (non-uniform) 1-1 and size-increasing reductions.","PeriodicalId":193513,"journal":{"name":"Proceedings 17th IEEE Annual Conference on Computational Complexity","volume":"71 2","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 17th IEEE Annual Conference on Computational Complexity","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCC.2002.1004349","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
It is shown that, if there exist sets in E (the exponential complexity class) that require 2/sup /spl Omega/(n)/-sized circuits, then sets that are hard for class P (the polynomial complexity class) and above, under 1-1 reductions, are also hard under 1-1 size-increasing reductions. Under the assumption of the hardness of solving the RSA (Rivest-Shamir-Adleman, 1978) problem or the discrete log problem, it is shown that sets that are hard for class NP (nondeterministic polynomial) and above, under many-1 reductions, are also hard under (non-uniform) 1-1 and size-increasing reductions.