{"title":"A low-cost input vector monitoring concurrent BIST scheme","authors":"I. Voyiatzis, C. Efstathiou, C. Sgouropoulou","doi":"10.1109/IOLTS.2013.6604074","DOIUrl":null,"url":null,"abstract":"Input vector monitoring concurrent BIST schemes perform testing concurrently with the operation of the circuit. In this work a novel input vector monitoring concurrent BIST scheme is presented that compares favorably to previously proposed schemes with respect to the required hardware overhead.","PeriodicalId":423175,"journal":{"name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2013.6604074","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Input vector monitoring concurrent BIST schemes perform testing concurrently with the operation of the circuit. In this work a novel input vector monitoring concurrent BIST scheme is presented that compares favorably to previously proposed schemes with respect to the required hardware overhead.
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