{"title":"Product-Line Models to Address Requirements Uncertainty, Volatility and Risk","authors":"Z. Stephenson, Katrina Attwood, J. Mcdermid","doi":"10.1007/978-3-642-21001-3_8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":268699,"journal":{"name":"Relating Software Requirements and Architectures","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Relating Software Requirements and Architectures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-642-21001-3_8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
