MEMST: Cloning Memory Behavior using Stochastic Traces

Ganesh Balakrishnan, Yan Solihin
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引用次数: 7

Abstract

Memory Controller and DRAM architecture are critical aspects of Chip Multi Processor (CMP) design. A good design needs an in-depth understanding of end-user workloads. However, designers rarely get insights into end-user workloads because of the proprietary nature of source code or data. Workload cloning is an emerging approach that can bridge this gap by creating a proxy for the proprietary workload (clone). Cloning involves profiling workloads to glean key statistics and then generating a clone offline for use in the design environment. However, there are no existing cloning techniques for accurately capturing memory controller and DRAM behavior that can be used by designers for a wide design space exploration. We propose Memory EMulation using Stochastic Traces, MEMST, a highly accurate black box cloning framework for capturing DRAM and MC behavior. We provide a detailed analysis of statistics that are necessary to model a workload accurately. We will also show how a clone can be generated from these statistics using a novel stochastic method. Finally, we will validate our framework across a wide design space by varying DRAM organization, address mapping, DRAM frequency, page policy, scheduling policy, input bus bandwidth, chipset latency, DRAM die revision, DRAM generation and DRAM refresh policy. We evaluated MEMST using CPU2006, BioBench, Stream and PARSEC benchmark suites across the design space for single-core, dual-core, quad-core and octa-core CMPs. We measured both performance and power metrics for the original workload and clones. The clones show a very high degree of correlation with the original workload for over 7900 data points with an average error of 1.8% and 1.6% for transaction latency and DRAM power respectively.
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MEMST:使用随机轨迹克隆记忆行为
存储器控制器和DRAM架构是芯片多处理器(CMP)设计的关键方面。一个好的设计需要深入了解最终用户的工作负载。然而,由于源代码或数据的专有性质,设计人员很少能够深入了解最终用户的工作负载。工作负载克隆是一种新兴的方法,它可以通过为专有工作负载创建代理(克隆)来弥补这一差距。克隆包括分析工作负载以收集关键统计信息,然后脱机生成一个克隆以在设计环境中使用。然而,没有现有的克隆技术可以准确地捕捉存储器控制器和DRAM行为,可以被设计师用于广泛的设计空间探索。我们提出内存仿真使用随机轨迹,MEMST,一个高度精确的黑盒克隆框架捕捉DRAM和MC行为。我们提供了对准确建模工作负载所必需的统计数据的详细分析。我们还将展示如何使用一种新的随机方法从这些统计数据中生成克隆。最后,我们将通过改变DRAM组织、地址映射、DRAM频率、页面策略、调度策略、输入总线带宽、芯片组延迟、DRAM芯片修订、DRAM生成和DRAM刷新策略,在广泛的设计空间中验证我们的框架。我们在单核、双核、四核和八核cmp的设计空间中使用CPU2006、bibench、Stream和PARSEC基准套件来评估MEMST。我们测量了原始工作负载和克隆的性能和功耗指标。克隆与超过7900个数据点的原始工作负载具有非常高的相关性,事务延迟和DRAM功耗的平均误差分别为1.8%和1.6%。
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