{"title":"Particle Image Velocimetry","authors":"K. Hinsch","doi":"10.1201/9781003067061-6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":169992,"journal":{"name":"Speckle Metrology","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Speckle Metrology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781003067061-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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