Implementation of ITER fast plant interlock system using FPGAs with cRIO

E. Barrera, M. Ruiz, A. Bustos, M. Afif, B. Radle, J. Fernández-Hernando, I. Prieto, R. Pedica, Miguel J. Barcala, J. Oller, R. Castro
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引用次数: 1

Abstract

Interlocks are the instrumented functions of ITER that protect the machine against failures of the plant system components or incorrect machine operation. Regarding I&C, the Interlock Control System (ICS) ensures that no failure of the conventional ITER controls can lead to a serious damage of the machine integrity or availability. The ICS is in charge of the supervision and control of all the ITER components involved in the instrumented protection of the Tokamak and its auxiliary systems. It is constituted by the Central Interlock System (CIS), the different Plant Interlock Systems (PIS) and its networks. The ICS does not include the sensors and actuators of the plant systems but it is in charge of their control. The ITER interlock system shall be designed, built and operated according to the highest quality standards. The international standard IEC-61508 has been chosen as the reference. In both CIS and PIS cases two main architectures are used: a slow architecture, for those functions with response time requirements slower than 100ms (300 ms for central interlock functions), based on PLC technologies, and a fast architecture, based on FPGA technologies, for the functions with faster requirement times. The proposed design for fast PIS is based on the use of RIO (Reconfigurable Input/Output) technology from National Instruments (compactRIO platform). In order to provide a high integrity solution, a FMEDA (Failure Modes Effects and Diagnostics Analysis) has been conducted to analyze the components behavior. According to the output of the FMEDA a set of diagnostics has been defined and additional redundancy was added to the architecture to improve the integrity figures. The defined configuration has been called the “double-decker solution”, with two chassis running in parallel, communicated between them using a synchronous high speed serial line, and using redundant modules to implement the input and output measurement/excitations and redundant analog and digital modules to implement the diagnostics of these input/output modules. The integrity figures for the “double decker” solution are obtained from the classification of the failure rates, obtaining for the different configurations a SFF (safe failure fraction) of 85% and a FPH (Probability of dangerous Failure per Hour) of less than 1E-07. The FPGA design includes all the hardware to support the data acquisition from the input modules, the implementation of the diagnostics functionalities for analog and digital modules, the voting schema and the activation/deactivation of digital outputs. The platform includes an external test platform, also based on compactRIO technology, to perform the validation of the system and to register the performance of the different interlock functions implemented. The response times obtained for the TTL input to TTL output interlock function ranges from 5μs to 20μs; for the analog input to TTL output the response time is in the range of 41 μs to 90 μs, and for interlock functions using 24V digital input to 24V digital output, the time can rise up to 643 μs.
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用fpga和cRIO实现ITER快速电站联锁系统
联锁是ITER的仪表功能,可以保护机器不受工厂系统组件故障或机器不正确操作的影响。在I&C方面,联锁控制系统(ICS)确保传统ITER控制系统的故障不会导致机器完整性或可用性的严重损坏。ICS负责监督和控制所有涉及托卡马克及其辅助系统仪表保护的ITER组件。它由中央联锁系统(CIS)、各工厂联锁系统(PIS)及其网络组成。ICS不包括工厂系统的传感器和执行器,但它负责它们的控制。ITER联锁系统应按照最高质量标准设计、建造和运行。参照国际标准IEC-61508。在CIS和PIS两种情况下,使用两种主要架构:基于PLC技术的慢速架构,用于响应时间要求低于100ms的功能(中央联锁功能为300 ms),以及基于FPGA技术的快速架构,用于需求时间更快的功能。提出的快速PIS设计基于使用美国国家仪器公司(compactRIO平台)的RIO(可重构输入/输出)技术。为了提供高完整性的解决方案,进行了FMEDA(失效模式影响和诊断分析)来分析组件的行为。根据FMEDA的输出定义了一组诊断,并在体系结构中增加了额外的冗余,以提高完整性数据。所定义的配置被称为“双层解决方案”,两个机箱并联运行,它们之间使用同步高速串行线进行通信,并使用冗余模块实现输入和输出测量/激励,使用冗余模拟和数字模块实现这些输入/输出模块的诊断。“双层”解决方案的完整性数据是从故障率分类中获得的,不同配置的SFF(安全失效分数)为85%,FPH(每小时危险失效概率)小于1E-07。FPGA设计包括所有硬件,以支持从输入模块采集数据,实现模拟和数字模块的诊断功能,投票模式和数字输出的激活/停用。该平台包括一个外部测试平台,同样基于compactRIO技术,用于执行系统验证和记录不同联锁功能的性能。TTL输入到TTL输出联锁功能的响应时间范围为5μs ~ 20μs;模拟输入到TTL输出的响应时间范围为41 μs ~ 90 μs, 24V数字输入到24V数字输出的联锁功能的响应时间可达643 μs。
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