Array and high voltage path design for SONOS flash memory

Dong Wu, L. Pan, Lei Sun, Jun Zhu
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Abstract

A 1.8 V/3.3 V 4 Mb Embedded SONOS flash memory has been successfully developed and verified with a 0.18 mum CMOS logic compatible integrated technology, in which a reverse read array architecture and a novel decoder circuit are proposed to improve the read speed and to reduce the chip area. Moreover, a high voltage path is also introduced to improve the stability and reliability of the system. The test results show that the high voltage path timing is correct, and that the chip area and the read speed are 4.4 mm2 and 17 ns, respectively.
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SONOS闪存阵列及高压路径设计
采用0.18 μ m CMOS逻辑兼容集成技术,成功开发了1.8 V/3.3 V 4mb嵌入式SONOS闪存,并对其进行了验证,其中提出了一种反向读取阵列架构和一种新颖的解码电路,以提高读取速度和减小芯片面积。此外,为了提高系统的稳定性和可靠性,还引入了高压通道。测试结果表明,高压路径时序正确,芯片面积为4.4 mm2,读取速度为17 ns。
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