MEMS-based particle size magnifier for measuring ultra low nanoparticle concentration

H. Kwon, S. Yoo, J. S. Han, S. M. Lee, U. Hong, J. Hwang, Y. J. Kim
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引用次数: 2

Abstract

This paper firstly reports a MEMS-based particle size magnifier. By growing nanoparticles to a diameter greater than 1 μm, the proposed device enables optical methods to detect the individual nanoparticles which cannot be seen optically due to their small size. The proposed device shows the potential of realizing a compact and low cost nanoparticle sensor which can measure ultra-low nanoparticle concentration, while the recent MEMS-based particle sensors are only applicable for high particle concentration environment.
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用于测量超低纳米颗粒浓度的mems粒度放大器
本文首次报道了一种基于mems的粒径放大装置。通过将纳米颗粒生长到直径大于1 μm,该装置使光学方法能够检测由于其小尺寸而无法在光学上看到的单个纳米颗粒。目前基于mems的颗粒传感器仅适用于高颗粒浓度环境,而该器件显示了实现一种紧凑、低成本的纳米颗粒传感器的潜力,可以测量超低的纳米颗粒浓度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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