Effect of parameter optimization effort over mosfet models' performances in analog circuits' simulation

D. Balodi, C. Saha, P. A. Govidacharyulu
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引用次数: 2

Abstract

The importances of MOSFET parameter extraction process along with the requirements for good optimization strategy to obtain better modeling results are discussed. Scope for achieving the flexibilities in parameter extraction process and strategy formation has also been discussed with the example of BSIM MOSFET model in 0.8 μm CMOS technology and it is argued that with the poor extraction strategy, even the more powerful BSIM3 (Level-49) model produces the comparable results to that of BSIM (Level-13) model. Finally the BSIM (Level-13 and Level-49) modeling efforts for various geometry devices are shown in comparative manner which are followed by qualitative analysis to conclude the important aspects of these models with optimization effects.
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模拟电路仿真中参数优化对大多数fet模型性能的影响
讨论了MOSFET参数提取过程的重要性以及良好的优化策略对获得较好的建模结果的要求。以0.8 μm CMOS技术中的BSIM MOSFET模型为例,讨论了在参数提取过程和策略形成中实现灵活性的范围,并认为在提取策略较差的情况下,即使功能更强大的BSIM3 (Level-49)模型也能产生与BSIM (Level-13)模型相当的结果。最后以比较的方式展示了BSIM (Level-13和Level-49)对各种几何器件的建模成果,然后进行定性分析,总结出这些模型具有优化效果的重要方面。
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