{"title":"Address Sequences Generation for Multiple Run Memory Testing","authors":"S. Yarmolik, I. Mrozek, B. Sokol","doi":"10.1109/CISIM.2007.9","DOIUrl":null,"url":null,"abstract":"This paper deals with address generation for multiple run memory tests. It presents the algorithms for address sequences generation and proposes the new method for address sequences generation. The experimental results with the proposed address sequence are also shown.","PeriodicalId":350490,"journal":{"name":"6th International Conference on Computer Information Systems and Industrial Management Applications (CISIM'07)","volume":"180 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"6th International Conference on Computer Information Systems and Industrial Management Applications (CISIM'07)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CISIM.2007.9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper deals with address generation for multiple run memory tests. It presents the algorithms for address sequences generation and proposes the new method for address sequences generation. The experimental results with the proposed address sequence are also shown.
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