{"title":"Q-band computerized slotted line system","authors":"T. An, J. Mao, Q. Meng, H. Yan, J. Fang","doi":"10.1109/MWSYM.1988.22141","DOIUrl":null,"url":null,"abstract":"An automatic test system for measuring network parameters at Q-band has been developed. The system is based on the conventional slotted line system and is controlled by the Apple II microcomputer. The principles, construction, and features of the system are presented. Typical results for complex reflection coefficient, voltage standing wave ratio, impedance, attenuation, and S-parameters are given. The system is expected to be valuable in developing test systems at the short-millimeter-wave band.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988., IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1988.22141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
An automatic test system for measuring network parameters at Q-band has been developed. The system is based on the conventional slotted line system and is controlled by the Apple II microcomputer. The principles, construction, and features of the system are presented. Typical results for complex reflection coefficient, voltage standing wave ratio, impedance, attenuation, and S-parameters are given. The system is expected to be valuable in developing test systems at the short-millimeter-wave band.<>
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