{"title":"Built-in self-test for generated blocks in an ASIC environment","authors":"V. Bruchner, A. Achuetz","doi":"10.1109/EASIC.1990.207962","DOIUrl":null,"url":null,"abstract":"Techniques for Built-in Self-Test of RAMs embedded within ASIC's are presented. The test algorithm (sequence) has been laid out with emphasis on high fault coverage and low silicon overhead. It supports existing RAM generator tool and allows for generating a wide spectrum of possible configurations. The BIST circuit itself is a soft-macro built from standard library elements. The schematic will be generated automatically on design station according to user specifications. User friendliness was a top goal for the development.<<ETX>>","PeriodicalId":205695,"journal":{"name":"[Proceedings] EURO ASIC `90","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] EURO ASIC `90","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EASIC.1990.207962","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Techniques for Built-in Self-Test of RAMs embedded within ASIC's are presented. The test algorithm (sequence) has been laid out with emphasis on high fault coverage and low silicon overhead. It supports existing RAM generator tool and allows for generating a wide spectrum of possible configurations. The BIST circuit itself is a soft-macro built from standard library elements. The schematic will be generated automatically on design station according to user specifications. User friendliness was a top goal for the development.<>
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
![[Proceedings] EURO ASIC `90](/Content/css/sci/img/zetp.jpg)
求助内容：
应助结果提醒方式：
扫码关注我们
