Digital circuit susceptibility characterization to RF and microwave disturbances

Abstract

The functional susceptibility of electronic circuits to radio-radar-type bursts is controlled by two factors: the energy coupling and propagation on interconnecting elements, cables and PCB's tracks on one hand, the intrinsic susceptibility of ICs, on the other hand. This paper addresses the problem of the upset threshold measurement in modern digital circuits stressed by conducted out-of-band signals. The results establish and quantify the variability associated with the injection circuit, the packaging and its interface with the PCB, the excitation shape and its position in the functional time sequence. An optimized characterization method is proposed to collect reproducible and useful data.