Thermopower characterization of InSb nanowires using thermoreflectance

2017 23rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Pub Date : 2017-12-21 DOI:10.1109/THERMINIC.2017.8233802

R. Chavez, D. Vakulov, S. Gazibegović, D. Car, D. Kendig, A. Tay, A. Shakouri, E. Bakkers

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引用次数: 2

Abstract

Increasing energy demand and depleting fossil fuels make it imperative to shift to more efficient energy sources. Thermoelectric materials can convert waste heat into electrical energy by means of the Thermopower or Seebeck effect. Nanowires are promising candidates to increase the efficiency of thermo-electric conversion because their low dimensionality is predicted to increase the Seebeck effect due to confinement of charge carriers and decrease thermal conductivity due to boundary scattering of phonons. The Seebeck effect is characterized by the Seebeck coefficient which describes the output voltage per degree Kelvin in a thermoelectric material. Hence, in order to obtain the Seebeck coefficient, it is crucial to accurately measure the temperature difference along the axial direction of the nanowire which has a length of a few micrometers, at the locations where voltage measurements are performed under a temperature gradient. Here we demonstrate an application of thermoreflectance to measure the temperature difference along the nanowire allowing bi-directional measurements of Seebeck coefficient.

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利用热反射率表征InSb纳米线的热功率

不断增长的能源需求和日益枯竭的化石燃料使得转向更高效的能源成为当务之急。热电材料可以通过热电效应或塞贝克效应将余热转化为电能。纳米线是提高热电转换效率的有希望的候选者，因为它们的低维数被预测会增加塞贝克效应，因为电荷载流子的限制，降低热导率，因为声子的边界散射。塞贝克效应用塞贝克系数来描述热电材料中每开尔文度的输出电压。因此，为了获得塞贝克系数，在温度梯度下进行电压测量的位置，精确测量长度为几微米的纳米线沿轴向的温差是至关重要的。在这里，我们演示了热反射的应用，以测量沿纳米线的温差，允许塞贝克系数的双向测量。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2017 23rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)

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