Dynamic characteristic evaluation of a 600V reverse blocking IGBT device

O. Korkh, A. Blinov
{"title":"Dynamic characteristic evaluation of a 600V reverse blocking IGBT device","authors":"O. Korkh, A. Blinov","doi":"10.1109/AIEEE.2017.8270527","DOIUrl":null,"url":null,"abstract":"This paper presents an overview and analysis of operation of RB IGBT transistors. The series of experiments is devoted characterisation of 600 V, 85 A RB IGBT devices under hard and soft switching conditions using a double-pulse test circuit. The switching behaviour, particularly turn-on and turn-off characteristics, of these devices under various conditions are evaluated. Obtained results allow to assess the impact of reverse recovery process on the turn-on losses and compare the characteristic of RB IGBTs with various types of discrete diodes.","PeriodicalId":224275,"journal":{"name":"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AIEEE.2017.8270527","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

This paper presents an overview and analysis of operation of RB IGBT transistors. The series of experiments is devoted characterisation of 600 V, 85 A RB IGBT devices under hard and soft switching conditions using a double-pulse test circuit. The switching behaviour, particularly turn-on and turn-off characteristics, of these devices under various conditions are evaluated. Obtained results allow to assess the impact of reverse recovery process on the turn-on losses and compare the characteristic of RB IGBTs with various types of discrete diodes.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
600V反向阻断IGBT器件动态特性评估
本文对RB型IGBT晶体管的工作原理进行了概述和分析。利用双脉冲测试电路,对600 V, 85 A的RB IGBT器件在硬开关和软开关条件下的特性进行了研究。评估了这些器件在各种条件下的开关行为,特别是通断特性。获得的结果可以评估反向恢复过程对导通损耗的影响,并将RB igbt与各种类型的分立二极管的特性进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Application of educational data mining to create intelligent multi-agent personalised learning system Stereoscopic focus moment identification based on pupil dynamics measures Dynamic characteristic evaluation of a 600V reverse blocking IGBT device Experimental testing of distance protection performance in transient fault path resistance environment Edge computing in IoT: Preliminary results on modeling and performance analysis
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1