Time of flight (TOF) measurement of adjacent pulses

Abstract

Time of Flight (TOF) measurement technique of adjacent pulses with sub-nano second interval is presented. In the conventional TOF measurement, the measurement of adjacent pulses is restricted to dead time or recovery time of a single TDC circuit. In the proposed TOF measurement technique, adjacent pulses are distributed to multiple TDCs in the order of arriving sequences in the distribution system. Thus measurement time is not restricted to the dead time or recovery time of a single TDC circuit. In the distribution system, programmable delay circuits are used to optimize the timing of the system so that minimum interval of measurable adjacent pulses is optimized. In this paper, the configuration and modules for measuring adjacent pulses are explained in section I, and various topologies for distribution system are explained in section II. The hardware implementation is considered in section III. And finally the conclusion and future works are presented in section IV.