Measurement & Calibration Procedure for the Characterization of the Scattering Parameters in Microwave Fiber-Optic Devices

A. H. Quoc, S. Tedjini
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引用次数: 14

Abstract

A new measurement procedure is developed for the determination of optoelectronic scattering parameters in fiber-optic devices working in microwave modulating frequency range. The measurement scheme is based on a microwave network analyzer and optoelectronic transducers to determiine the optical parameters by the use of corresponding electrical parameters. The application of the TMR (Through, Match, Reflect) calibration procedure for optical measurements is straightforward, which requires for the realization of the needed optical standards only commercially available elements. The error removal can be performed in a wide modulating frequency range both in transmission and reflection measurements. The validity of this measurement calibration procedure is demonstrated by some measurement examples.
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微波光纤器件散射参数表征的测量与校准程序
提出了一种测量微波调制频率范围内光纤器件光电散射参数的新方法。该测量方案是基于微波网络分析仪和光电换能器,利用相应的电学参数来确定光学参数。TMR(通过,匹配,反射)校准程序在光学测量中的应用是直接的,它只需要实现所需的光学标准,只有市售的元件。在传输和反射测量中,误差消除可以在较宽的调制频率范围内进行。通过一些测量实例验证了该测量校准程序的有效性。
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