An identification method of counterfeit components based on physical analysis test technology

Abstract

With the rise of counterfeiting, and counterfeit electronic components are widely used in various field. Although the components used in the military equipment are through the layers of quality checks before installed, there are still a lot of counterfeit components do not be checked out. In this paper, an identification method for counterfeit components based on physical analysis test techniques, such as visual inspection, scanning acoustic microscope (SAM) and scanning electron microscope (SEM) examination, was proposed. And a case was applied and analyzed, which indicated that the proposed method can identify counterfeit devices effectively.