Investigation of enhanced solder wetting in 63Sn/37Pb and Sn-Ag-Cu lead free alloy

S. Anson, J.G. Slezak, K. Srihari
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Abstract

Enhanced or equivalent solder paste wetting on organic solderability preservative (OSP) circuit boards in 63Sn/37Pb and 96.5Sn/3.0Ag/0.5Cu at lower peak temperature and time above liquidus (TAL) has been published previously. These results are contrary to common belief and practice in microelectronics soldering. Microelectronics and general metal wetting literature will be reviewed to generate hypotheses about the cause of the enhanced or equivalent solder wetting. The former wetted area experiments were conducted using design of experiments (DOE) techniques and now analysis outside of the DOE will be conducted to test the new hypotheses and advance the knowledge of solder wetting. Industry relevant manufacturing equipment, materials and processes were used. After detailed analysis, the enhanced or equivalent wetting appears to be unique to the proprietary flux chemistry.
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63Sn/37Pb和Sn-Ag-Cu无铅合金中增强焊料润湿的研究
在63Sn/37Pb和96.5Sn/3.0Ag/0.5Cu的有机可焊性防腐剂(OSP)电路板上,在较低的峰值温度和高于液相线(TAL)的时间(TAL)下,锡膏润湿增强或等效已经发表。这些结果与微电子焊接的普遍信念和实践相反。微电子和一般金属润湿文献将被审查,以产生关于增强或等效焊料润湿的原因的假设。以前的润湿区实验是使用实验设计(DOE)技术进行的,现在将在DOE之外进行分析,以测试新的假设并推进焊料润湿的知识。采用了行业相关的制造设备、材料和工艺。经过详细分析,增强或等效润湿似乎是专有的助熔剂化学所独有的。
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