RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology

C. Kelma, S. Darfeuille, A. Neuburger, Andreas Lobnig
{"title":"RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology","authors":"C. Kelma, S. Darfeuille, A. Neuburger, Andreas Lobnig","doi":"10.1109/ETS.2013.6569387","DOIUrl":null,"url":null,"abstract":"This paper focuses on the RF BIST architecture of the receive path of an RF transceiver processed in the NXP in house CMOS technology with 0.14μm gate length.","PeriodicalId":118063,"journal":{"name":"2013 18th IEEE European Test Symposium (ETS)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 18th IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2013.6569387","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper focuses on the RF BIST architecture of the receive path of an RF transceiver processed in the NXP in house CMOS technology with 0.14μm gate length.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于CMOS技术的射频收发器接收部分的测试策略
研究了栅极长度为0.14μm的恩智浦内部CMOS技术射频收发器接收路径的射频BIST结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Experimental evaluation of thread distribution effects on multiple output errors in GPUs A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology Current testing: Dead or alive? Efficient fault simulation through dynamic binary translation for dependability analysis of embedded software
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1