Design high performance and low power 10T full adder cell using double gate MOSFET at 45nm technology

A. Shrivastava, S. Akashe
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引用次数: 11

Abstract

Design of complex arithmetic logic circuits considering leakage current, active power and delay is an important and challenging task in deep submicron circuits. Double gate transistor circuit consider as a promising candidate for low power application domain as well as used in Radio Frequency (RF) devices. In this paper we designed full adder with the help of double gate transistor, the used parameters value has been varied significantly thus improving the performance of full adder. Power Gating is one of the most used circuit techniques to reduce the leakage current in idle circuit. In this paper different parameters are analysed on Power Gating Technique. Power Gating technique achieves 93% reduction of leakage current, active power is reduced by 60% and delay is reduced by 14% as compared with conventional double gate full adder. Simulation results of double gate full adder have been performed on cadence virtuoso with 45nm technology.
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采用45纳米双栅MOSFET技术设计高性能低功耗10T全加法器单元
在深亚微米电路中,考虑漏电流、有功功率和时延的复杂算术逻辑电路设计是一项重要而富有挑战性的任务。双栅晶体管电路被认为是低功耗应用领域的一个很有前途的候选者,并且在射频(RF)器件中得到了应用。本文利用双栅晶体管设计了全加法器,使用的参数值发生了很大的变化,从而提高了全加法器的性能。功率门控是一种常用的减小电路漏电流的电路技术。本文对功率门控技术的不同参数进行了分析。与传统的双栅全加法器相比,功率门控技术使漏电流降低93%,有功功率降低60%,延时降低14%。在cadence virtuoso上采用45nm技术对双栅全加法器进行了仿真。
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