{"title":"Predicting Cole-Cole parameters of microfluids with microstrip technology","authors":"A. Santorelli, J. Schwartz","doi":"10.1109/SAS.2014.6798949","DOIUrl":null,"url":null,"abstract":"In this paper we present the novel design of a microstrip sensor to measure the broadband complex permittivity of small fluid samples and accurately predict their Cole-Cole parameters. This novel approach differs from prior works by placing the fluid analyte in an enclosed chamber underneath the trace of a suspended microstrip, allowing for better overlap between the electromagnetic fields and the fluid in comparison with microfluidic sensors in coplanar technology. A simple direct measurement technique that exploits device symmetry is proposed to extract the dielectric properties of the fluid from full 2-port scattering parameters and is validated through simulation data.","PeriodicalId":125872,"journal":{"name":"2014 IEEE Sensors Applications Symposium (SAS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Sensors Applications Symposium (SAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SAS.2014.6798949","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
In this paper we present the novel design of a microstrip sensor to measure the broadband complex permittivity of small fluid samples and accurately predict their Cole-Cole parameters. This novel approach differs from prior works by placing the fluid analyte in an enclosed chamber underneath the trace of a suspended microstrip, allowing for better overlap between the electromagnetic fields and the fluid in comparison with microfluidic sensors in coplanar technology. A simple direct measurement technique that exploits device symmetry is proposed to extract the dielectric properties of the fluid from full 2-port scattering parameters and is validated through simulation data.