The Effects of Mechanical Thin-film Properties on the Pyroelectric Signals

C. Wei, C. Hsiao, Yuh-Chung Hu
{"title":"The Effects of Mechanical Thin-film Properties on the Pyroelectric Signals","authors":"C. Wei, C. Hsiao, Yuh-Chung Hu","doi":"10.1109/NEMS.2007.352014","DOIUrl":null,"url":null,"abstract":"The ZnO pyroelectric sensors with configuration of partially covered electrode were used to discuss the correlation between its voltage responsivity, morphology and mechanical properties of the thin film. The sensor based on pyroelectric thin film deposited by sputtering with RF power of 120 W was revealed higher voltage responsivity than those of 150 W and 90 W for 10-400 times. Meanwhile, the surface morphology reveals less defects and uniform grain size for the RF power of 120 W as characterized by SEM, which can be a symptom of the high voltage responsivity. On the other hand, the effective elastic modulus and hardness of ZnO film sputtered with RF power of 120 W were significantly (P Lt 0.05) larger than that of 90 W (21%) and (32%), and 150 W about 23% and 37%, respectively. Therefore, the effects of sputtering power on the voltage responsivity of the pyroelectric sensor can be analyzed and interpreted by the SEM morphology and its mechanical properties.","PeriodicalId":364039,"journal":{"name":"2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEMS.2007.352014","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The ZnO pyroelectric sensors with configuration of partially covered electrode were used to discuss the correlation between its voltage responsivity, morphology and mechanical properties of the thin film. The sensor based on pyroelectric thin film deposited by sputtering with RF power of 120 W was revealed higher voltage responsivity than those of 150 W and 90 W for 10-400 times. Meanwhile, the surface morphology reveals less defects and uniform grain size for the RF power of 120 W as characterized by SEM, which can be a symptom of the high voltage responsivity. On the other hand, the effective elastic modulus and hardness of ZnO film sputtered with RF power of 120 W were significantly (P Lt 0.05) larger than that of 90 W (21%) and (32%), and 150 W about 23% and 37%, respectively. Therefore, the effects of sputtering power on the voltage responsivity of the pyroelectric sensor can be analyzed and interpreted by the SEM morphology and its mechanical properties.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
机械薄膜性质对热释电信号的影响
采用部分覆盖电极结构的ZnO热释电传感器,讨论了其电压响应性、薄膜形貌和力学性能之间的关系。在120 W射频功率下溅射制备的热释电薄膜传感器显示出比150 W和90 W高10-400倍的电压响应性。同时,在RF功率为120 W时,表面形貌缺陷较少,晶粒尺寸均匀,这可能是高电压响应性的表现。另一方面,射频功率为120 W时溅射ZnO薄膜的有效弹性模量和硬度分别显著(P < 0.05)大于90 W时的21%和32%,大于150 W时的23%和37%。因此,溅射功率对热释电传感器电压响应性的影响可以通过SEM形貌及其力学性能来分析和解释。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Conference Venue Information Design and Manufacture of Novel MEMS-based Dielectrophoretic Biochip Plenary Speech: Spin Excitation Spectroscopy with the STM Fluorescence Visualization of Carbon Nanotubes Using Quenching Effect for Nanomanipulation Polymer-Enabled Carbon Nanotube Deposition for Cellular Interrogation Applications
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1