Y. Saitoh, J. Yamanaka, H. Suzuki, S. Miyahara, M. Kamiya, K. Kadoi, T. Masusda, K. Maemura, M. Inoue, A. Suzuki, H. Takeuchi, M. Mandai, H. Kanazawa, Y. Higashi, H. Ikeda, S. Koike, T. Matsuda, H. Ozaki, M. Tanaka, T. Tsuboyama, S. Avrillon, S. Okuno, J. Haba, H. Hamai, S. Mori, K. Yusa
{"title":"Development of novel architecture and assembly techniques for a detector unit for a silicon micro-vertex detector using the flip-chip bonding method","authors":"Y. Saitoh, J. Yamanaka, H. Suzuki, S. Miyahara, M. Kamiya, K. Kadoi, T. Masusda, K. Maemura, M. Inoue, A. Suzuki, H. Takeuchi, M. Mandai, H. Kanazawa, Y. Higashi, H. Ikeda, S. Koike, T. Matsuda, H. Ozaki, M. Tanaka, T. Tsuboyama, S. Avrillon, S. Okuno, J. Haba, H. Hamai, S. Mori, K. Yusa","doi":"10.1109/NSSMIC.1992.301207","DOIUrl":null,"url":null,"abstract":"Full-size models of a detector unit for a silicon microvertex detector for the KEK B factory have been built. The model consists of four dummy double-sided, double-metal silicon microstrip detectors and two silicon end-boards mounted with dummy readout VLSIs on both sides. In this trial the flip-chip bonding method, using an anisotropic conductive film, is applied to both sides of the detector unit to bond 640 strips at a pitch of 50 mu m.<<ETX>>","PeriodicalId":447239,"journal":{"name":"IEEE Conference on Nuclear Science Symposium and Medical Imaging","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Conference on Nuclear Science Symposium and Medical Imaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSSMIC.1992.301207","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Full-size models of a detector unit for a silicon microvertex detector for the KEK B factory have been built. The model consists of four dummy double-sided, double-metal silicon microstrip detectors and two silicon end-boards mounted with dummy readout VLSIs on both sides. In this trial the flip-chip bonding method, using an anisotropic conductive film, is applied to both sides of the detector unit to bond 640 strips at a pitch of 50 mu m.<>