{"title":"Automotive requirements to non-volatile memories — A holistic approach to qualification","authors":"V. Kottler","doi":"10.1109/IEDM.2016.7838396","DOIUrl":null,"url":null,"abstract":"This work describes a holistic approach to the application of the Robustness Validation methodology to the qualification of non-volatile memories (NVM) for automotive applications, as well as the resulting requirements to the NVM supplier and to the NVM design and technology.","PeriodicalId":186544,"journal":{"name":"2016 IEEE International Electron Devices Meeting (IEDM)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2016.7838396","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This work describes a holistic approach to the application of the Robustness Validation methodology to the qualification of non-volatile memories (NVM) for automotive applications, as well as the resulting requirements to the NVM supplier and to the NVM design and technology.
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