Novel RPM technique to dismiss systematic variation for RO PUF on FPGA

M. Mustapa, M. Niamat
{"title":"Novel RPM technique to dismiss systematic variation for RO PUF on FPGA","authors":"M. Mustapa, M. Niamat","doi":"10.1109/NAECON.2014.7045838","DOIUrl":null,"url":null,"abstract":"Physical Unclonable Function (PUF) is a function that cannot be modeled as it utilizes the random process variations on a silicon chip to generate a unique bit stream of `1's and `0's (response bits) which can be used for authentication and cryptography applications. As PUF is highly rely upon process variations, the response bits generated are governed by the systematic process variation instead of the stochastic process variation, which will reduce the randomness in the response bits. In this paper we propose the novel Random Patch Mixer (RPM) technique to dismiss the systematic variation effect on the response bits generated. We applied the RPM technique on data obtained from 29 Spartan 3E FPGA chips. We showed that our RPM technique has successfully dismissed the systematic variation effect on the response bits generated from the ROPUF on FPGA. We also proved that the responses generated by applying the RPM Technique passed the National Institute of Standards and Technology NIST statistical test for randomness.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAECON.2014.7045838","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Physical Unclonable Function (PUF) is a function that cannot be modeled as it utilizes the random process variations on a silicon chip to generate a unique bit stream of `1's and `0's (response bits) which can be used for authentication and cryptography applications. As PUF is highly rely upon process variations, the response bits generated are governed by the systematic process variation instead of the stochastic process variation, which will reduce the randomness in the response bits. In this paper we propose the novel Random Patch Mixer (RPM) technique to dismiss the systematic variation effect on the response bits generated. We applied the RPM technique on data obtained from 29 Spartan 3E FPGA chips. We showed that our RPM technique has successfully dismissed the systematic variation effect on the response bits generated from the ROPUF on FPGA. We also proved that the responses generated by applying the RPM Technique passed the National Institute of Standards and Technology NIST statistical test for randomness.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
FPGA上RO PUF系统变化的新型RPM技术
物理不可克隆函数(PUF)是一种无法建模的函数,因为它利用硅芯片上的随机过程变化来生成唯一的“1”和“0”(响应位)比特流,可用于身份验证和加密应用程序。由于PUF高度依赖过程变化,因此产生的响应位由系统过程变化而不是随机过程变化控制,从而降低了响应位的随机性。在本文中,我们提出了一种新的随机补片混频器(RPM)技术来消除系统变化对产生的响应位的影响。我们将RPM技术应用于从29个Spartan 3E FPGA芯片获得的数据。我们表明,我们的RPM技术已经成功地消除了FPGA上ROPUF产生的响应位的系统变化效应。我们还证明了应用RPM技术产生的响应通过了美国国家标准与技术研究所NIST的随机性统计检验。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Optimizing surface plasmonic structures for high infrared photodetector enhancement Surface plasmon enhanced rare earth fluorescence for increased imaging efficiency Construction of a twin-pier platform for biological sensing 10 bit current steering DAC in 90 nm technology Photonic jets for strained-layer superlattice infrared photodetector enhancement
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1